Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| D427088 | Wafer level burn-in tester | Yoshihiko Asai | 2000-06-27 |
| D426785 | Wafer level burn-in tester | Yoshihiko Asai | 2000-06-20 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| D427088 | Wafer level burn-in tester | Yoshihiko Asai | 2000-06-27 |
| D426785 | Wafer level burn-in tester | Yoshihiko Asai | 2000-06-20 |