Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7155649 | Scan test control method and scan test circuit | Toshinobu Nakao, Shinji Ozaki | 2006-12-26 |
TS
Tomohisa SEZAKI
Overall (All Time): #3,437,618 of 4,157,543Top 85%
1
Patents All Time