Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12334874 | High frequency amplifier | Yutaka Moriyama | 2025-06-17 |
| 12199572 | High-frequency amplifier | Yutaka Moriyama | 2025-01-14 |
| 12176860 | High frequency amplifier | Yutaka Moriyama | 2024-12-24 |
| 12051998 | Amplifier circuit | — | 2024-07-30 |
| 11916519 | High frequency amplifier | Yutaka Moriyama | 2024-02-27 |
| 11444575 | Bias circuit | Hideki Tango, Harutoshi TSUJI | 2022-09-13 |
| 11152900 | Multistage amplifier | — | 2021-10-19 |
| 10924064 | Bias circuit | Hideki Tango, Harutoshi TSUJI | 2021-02-16 |
| 6333523 | Field-effect transistor | Ryoji Sakamoto | 2001-12-25 |
| 5835352 | Power amplifying module | Ken-ichiro Matsuzaki, Gaku Ishii, Kenji Otobe | 1998-11-10 |
| 5757251 | Electronic component contained in a metal package | Gaku Ishii, Kenji Otobe, Ken-ichiro Matsuzaki | 1998-05-26 |
| 5754402 | Power amplifying module | Ken-ichiro Matsuzaki, Gaku Ishii, Kenji Otobe | 1998-05-19 |
| 5457401 | Semiconductor device testing apparatus | — | 1995-10-10 |
| 5414370 | Burn-in apparatus and method which individually controls the temperature of a plurality of semiconductor devices | Masanori Nishiguchi | 1995-05-09 |
| 5410261 | Semiconductor device testing apparatus | — | 1995-04-25 |
| 5406212 | Burn-in apparatus and method for self-heating semiconductor devices having built-in temperature sensors | Masanori Nishiguchi | 1995-04-11 |
| 5359285 | Method and apparatus for varying temperature and electronic load conditions of a semiconductor device in a burn-in test chamber while performing a burn-in test | Masanori Nishiguchi | 1994-10-25 |
| 5327075 | Burn-in apparatus and method for semiconductor devices | Masanori Nishiguchi | 1994-07-05 |
| 5245276 | Semiconductor device storage jig | — | 1993-09-14 |