Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5923554 | Method for assessing the number and type of flaws | — | 1999-07-13 |
| 5828778 | Method and apparatus for analyzing failure of semiconductor wafer | Toshio Hagi | 1998-10-27 |
| 5621668 | Prediction control method and a prediction control device | — | 1997-04-15 |