Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11821870 | Defect measurement device, defect measurement method, and inspection probe | Toyokazu Tada | 2023-11-21 |
| 10539535 | Defect measurement method, defect measurement device, and testing probe | Toyokazu Tada | 2020-01-21 |
| 9453818 | Eddy current flaw detection probe and eddy current flaw inspection apparatus | Toyokazu Tada, Daigo Kosaka | 2016-09-27 |
| 8928315 | Eddy current flaw detection probe | Mitsuo Hashimoto, Hisakazu Mori, Toyokazu Tada | 2015-01-06 |