Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12205830 | Cleaning apparatus for semiconductor wafer and method of cleaning semiconductor wafer | Kaito NODA, Yuki NAKAO, Michihiko TOMITA | 2025-01-21 |
| 8409349 | Film thickness measurement method, epitaxial wafer production process and epitaxial wafer | — | 2013-04-02 |
| 6892037 | Image forming apparatus, control system therefor, cartridge, and memory device mounted in cartridge | — | 2005-05-10 |