Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8928340 | Digital circuit testable through two pins | Philippe Lebourg, Thomas Droniou | 2015-01-06 |
| 7941738 | Method for characterizing a bit detection event | Herve Le-Gall, Jean-Christophe Pont | 2011-05-10 |
| 7739566 | Scan test circuitry using a state machine and a limited number of dedicated pins | — | 2010-06-15 |
| 7661040 | Method of testing a sequential access memory plane and a corresponding sequential access memory semiconductor device | Marc Beaujoin, Thomas Alofs | 2010-02-09 |