Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6815964 | Test board de-embedding method to improve RF measurements accuracy on an automatic testing equipment for IC wafers | Maria Luisa Gambina, Biagio Russo | 2004-11-09 |
| 6757632 | Method and apparatus for testing integrated circuits using a synchronization signal so that all measurements are allotted a time slot of the same length | Giuseppe Tuttobene, Biagio Russo | 2004-06-29 |