Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9128154 | Apparatus for at-speed testing, in inter-domain mode, of a multi-clock-domain digital integrated circuit according to BIST or SCAN techniques | — | 2015-09-08 |
| 8862955 | Apparatus for at-speed testing, in inter-domain mode, of a multi-clock-domain digital integrated circuit according to BIST or SCAN techniques | — | 2014-10-14 |