| 11531785 |
PUF-based data integrity |
Paul G. Flikkema, Bertrand F. Cambou |
2022-12-20 |
| 11343109 |
Secure enrollment for physical unclonable function devices |
Bertrand F. Cambou |
2022-05-24 |
| 10289577 |
System, method and computer-accessible medium for low-overhead security wrapper for memory access control of embedded systems |
Ramesh Karri, Jerry Backer |
2019-05-14 |
| 8495734 |
Method and device for detecting an erroneous jump during program execution |
Frederic Bancel, Nicolas Berard |
2013-07-23 |
| 7930605 |
Electronic circuit comprising a test mode secured by insertion of decoy data in the test chain, associated method |
Frederic Bancel |
2011-04-19 |
| 7921342 |
Integrated circuit comprising a test mode secured by the use of an identifier, and associated method |
Frederic Bancel |
2011-04-05 |
| 7768318 |
Detection of a disturbance in the state of an electronic circuit flip-flop |
Frederic Bancel, Nicolas Berard |
2010-08-03 |
| 7747935 |
Method and device for securing the reading of a memory |
Frederic Bancel, Nicolas Berard |
2010-06-29 |
| 7725786 |
Protecting an integrated circuit test mode |
Frederic Bancel |
2010-05-25 |
| 7694197 |
Integrated circuit comprising a test mode secured by detection of the state of a control signal |
Frederic Bancel |
2010-04-06 |
| 7676717 |
Electronic circuit comprising a test mode secured by the breaking of a test chain, and associated electronic circuit |
Frederic Bancel |
2010-03-09 |
| 7577886 |
Method for testing an electronic circuit comprising a test mode secured by the use of a signature, and associated electronic circuit |
Frederic Bancel |
2009-08-18 |
| 7568140 |
Integrated circuit having configurable cells and a secured test mode |
Frederic Bancel |
2009-07-28 |
| 7512852 |
Protecting an integrated circuit test mode |
Frederic Bancel |
2009-03-31 |
| 7484152 |
Securing the test mode of an integrated circuit |
Frederic Bancel |
2009-01-27 |
| 7478293 |
Method of securing the test mode of an integrated circuit via intrusion detection |
Frederic Bancel |
2009-01-13 |
| 7308635 |
Integrated circuit comprising a test mode secured by initialization of the test mode |
Frederic Bancel |
2007-12-11 |