Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8196216 | Systems for assessing and enhancing the performance of scanning probe microscopes by quantifying and enforcing symmetries and periodicities in two dimensions | — | 2012-06-05 |
| 8131481 | Database supported nanocrystal structure identification by lattice-fringe fingerprinting with structure factor extraction | — | 2012-03-06 |
| 7472576 | Nanometrology device standards for scanning probe microscopes and processes for their fabrication and use | — | 2009-01-06 |