Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9658947 | Method for ranking fault-test pairs based on waveform statistics in a mutation-based test program evaluation system | Tien-Chun Wei, Jean-Marc A. Forey, Kuo-Ching Lin, Michael Lyons | 2017-05-23 |
| 8359559 | Methods and systems for evaluating checker quality of a verification environment | Michael Lyons, Kuo-Ching Lin, Wei-Ting Tu, Chih-Wen Chang, Tein-Chun Wei | 2013-01-22 |