Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6456690 | X-ray generator, X-ray inspector and X-ray generation method | Koichi Yamada | 2002-09-24 |
| 5637870 | Method of analysis of distribution of concentration of substrate | — | 1997-06-10 |
| 5350919 | Quantitative analyzing method by a secondary ion mass spectrometric method and a secondary ion mass spectrometer | Takashi Hirano, Hideki Kimura | 1994-09-27 |