Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12394672 | Method for evaluating of defect area of wafer | — | 2025-08-19 |
| 10350685 | Method for preparing metal nanoparticles | Nam Hwi Hur, Byeongno Lee | 2019-07-16 |
| 9857319 | Method of measuring depth of damage of wafer | — | 2018-01-02 |
| 9527744 | Method for manufacturing reduced graphene oxide using solid hydrazine derivative | Nam Hwi Hur, Byeongno Lee | 2016-12-27 |