Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8223326 | Dark-field examination device | Tai-Wook Kim, Il-Hwan Lee | 2012-07-17 |
| 5726746 | Automatic inspection system for camera lenses and method thereof using a line charge coupled device | Seok-Won Lee, Geon-Mo Kang, Ho-Gyun Moon | 1998-03-10 |