DE

Dirk Ehrentraut

ST Slt Technologies: 9 patents #3 of 25Top 15%
SO Soraa: 4 patents #28 of 95Top 30%
DA Daishinku: 1 patents #36 of 68Top 55%
Overall (All Time): #335,035 of 4,157,543Top 9%
14
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12351942 Oxygen-doped group III metal nitride and method of manufacture Wenkan Jiang, Mark P. D'Evelyn 2025-07-08
11898269 Oxygen-doped group III metal nitride and method of manufacture Wenkan Jiang, Mark P. D'Evelyn 2024-02-13
11721549 Large area group III nitride crystals and substrates, methods of making, and methods of use Mark P. D'Evelyn, Wenkan Jiang, Drew W. CARDWELL 2023-08-08
11705322 Group III nitride substrate, method of making, and method of use Wenkan Jiang, Mark P. D'Evelyn, Derrick S. Kamber, Jonathan D. Cook, James WENGER 2023-07-18
10648102 Oxygen-doped group III metal nitride and method of manufacture Wenkan Jiang, Mark P. D'Evelyn 2020-05-12
10604865 Process for large-scale ammonothermal manufacturing of semipolar gallium nitride boules Mark P. D'Evelyn, Derrick S. Kamber, Bradley C. Downey 2020-03-31
10301745 Large area, low-defect gallium-containing nitride crystals, method of making, and method of use Mark P. D'Evelyn, Wenkan Jiang, Bradley C. Downey 2019-05-28
10145026 Process for large-scale ammonothermal manufacturing of semipolar gallium nitride boules Mark P. D'Evelyn, Derrick S. Kamber, Bradley C. Downey 2018-12-04
10036099 Process for large-scale ammonothermal manufacturing of gallium nitride boules Mark P. D'Evelyn, Derrick S. Kamber, Bradley C. Downey 2018-07-31
9589792 High quality group-III metal nitride crystals, methods of making, and methods of use Wenkan Jiang, Mark P. D'Evelyn, Derrick S. Kamber, Michael R. Krames 2017-03-07
9543392 Transparent group III metal nitride and method of manufacture Wenkan Jiang, Mark P. D'Evelyn 2017-01-10
9404197 Large area, low-defect gallium-containing nitride crystals, method of making, and method of use Mark P. D'Evelyn, Wenkan Jiang, Bradley C. Downey 2016-08-02
9275912 Method for quantification of extended defects in gallium-containing nitride crystals Wenkan Jiang, Bradley C. Downey, Mark P. D'Evelyn 2016-03-01
8920677 Scintillator material and scintillation detector Masataka Kano, Akira Wakamiya, Kohei Yamanoi, Toshihiko Shimizu, Nobuhiko Sarukura +1 more 2014-12-30