Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8546205 | Detecting a deposition condition | Lam T. Luu, Richard S. Bingle, Daniel C. Weaver | 2013-10-01 |
| 8481344 | Methods of evaporating metal onto a semiconductor wafer in a test wafer holder | Lam T. Luu, Shiban K. Tiku, Richard S. Bingle, Jens Albrecht Riege, Daniel C. Weaver | 2013-07-09 |
| 8415770 | Apparatus and methods for uniform metal plating | Jens Albrecht Riege, Shiban K. Tiku | 2013-04-09 |
| 8188575 | Apparatus and method for uniform metal plating | Jens Albrecht Riege, Shiban K. Tiku | 2012-05-29 |
| 8030725 | Apparatus and methods for detecting evaporation conditions | Lam T. Luu, Richard S. Bingle, Daniel C. Weaver | 2011-10-04 |
| 8022448 | Apparatus and methods for evaporation including test wafer holder | Lam T. Luu, Shiban K. Tiku, Richard S. Bingle, Jens Albrecht Riege, Daniel C. Weaver | 2011-09-20 |
| 6614117 | Method for metallization of a semiconductor substrate and related structure | Shiban K. Tiku, Richard S. Burton | 2003-09-02 |
| 6596635 | Method for metallization of a semiconductor substrate | Shiban K. Tiku, Richard S. Burton | 2003-07-22 |