WW

Wane D. Wier

SM Skf Condition Monitoring: 1 patents #12 of 15Top 80%
📍 San Diego, CA: #15,630 of 23,606 inventorsTop 70%
🗺 California: #247,236 of 386,348 inventorsTop 65%
Overall (All Time): #3,574,873 of 4,157,543Top 90%
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Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6199422 Method and system for fast probe failure determination Johannes I. Boerhout, Phillip L. Maness, Hoa Nguyen 2001-03-13