Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11754628 | Contact test device for hi-pot test and hi-pot test system having the same | Kyeong Tae Park | 2023-09-12 |
| 9606455 | Scan and step exposure system | Gon-Chul Lee, Heung Ki Min, Jun Hyeong Lee | 2017-03-28 |