Issued Patents All Time
Showing 26–31 of 31 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7940585 | Multi-column decoder stress test circuit | Shin-Ho Chun | 2011-05-10 |
| 7920437 | Address control circuit of semiconductor memory apparatus | — | 2011-04-05 |
| 7864613 | Thermal code transmission circuit and semiconductor memory device using the same | Youk Hee Kim | 2011-01-04 |
| 7800964 | Wafer burn-in test circuit | Youk Hee Kim | 2010-09-21 |
| 7688663 | Anti-fuse repair control circuit and semiconductor device including DRAM having the same | Shin Ho Chu | 2010-03-30 |
| 7368953 | Buffer | Shin Ho Chu | 2008-05-06 |