Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11984446 | Semiconductor device with capacitors having different dielectric layer heights | Kyu Jin Choi, Kyu Chan SHIM | 2024-05-14 |
| 11626306 | Method for analyzing a semiconductor device | Jin Hee Han, Byoung-Ho Lee, Chang Hwan Lee, Jung-Min Lee | 2023-04-11 |
| 11295970 | System and method for analyzing a semiconductor device | Jin Hee Han, Byoung-Ho Lee, Chang Hwan Lee, Jung-Min Lee | 2022-04-05 |
| 9863752 | Metrology apparatus for a semiconductor pattern, metrology system including the same and metrology method using the same | Yoon Shik Kang, Joon Seong Hahn | 2018-01-09 |