Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11355926 | Test device | Jin Woo Kim, Chang Hwi LEE | 2022-06-07 |
| 10444265 | Method of extracting a current level for relating to the cutoff of an interconnection | Chang Hwi LEE, Sung-Bae Kim, Si-Woo Lee | 2019-10-15 |