HL

Hyun-Bae Lee

SH Sk Hynix: 19 patents #351 of 4,849Top 8%
Samsung: 17 patents #7,989 of 75,807Top 15%
DC Dongbu Electronics, Co.: 1 patents #160 of 281Top 60%
PF Postech Foundation: 1 patents #114 of 351Top 35%
Overall (All Time): #85,536 of 4,157,543Top 3%
38
Patents All Time

Issued Patents All Time

Showing 26–38 of 38 patents

Patent #TitleCo-InventorsDate
8932964 Method of forming a dielectric layer having an ONO structure using an in-situ process Woo Jin Lee, Ji-Soon Park, Jong-Myeong Lee 2015-01-13
8374043 Sense amplifier and semiconductor memory device using it Sang-Woong Shin 2013-02-12
8211793 Structures electrically connecting aluminum and copper interconnections and methods of forming the same Jong-Myeong Lee, Sang-Woo Lee, Gil-Heyun Choi, Jong-Won Hong, Kyung-In Choi 2012-07-03
8124524 Methods of forming metal interconnection structures Kyung-In Choi, Sang-Woo Lee, Jong-Myeong Lee, Jong-Won Hong 2012-02-28
8027193 Semiconductor memory device having bit line disturbance preventing unit 2011-09-27
7816255 Methods of forming a semiconductor device including a diffusion barrier film Kyung-In Choi, Gil-Heyun Choi, Jong-Won Hong, Jong-Myeong Lee 2010-10-19
7807571 Semiconductor device and methods of forming the same Kyung-In Choi, Gil-Heyun Choi, Sang-Woo Lee, Jong-Myeong Lee, Jong-Won Hong 2010-10-05
7759248 Semiconductor memory device and method of fabricating the same Seong-Hwee Cheong, Sang-Woo Lee, Jong-Won Hong, Seung-Gil Yang, Kyung-In Choi 2010-07-20
7724584 Semiconductor memory device and method of compensating for signal interference thereof 2010-05-25
7705690 Serpentine guard trace for reducing crosstalk of micro-strip line on printed circuit board Hong June Park 2010-04-27
7574178 Apparatus and method for cancelling interference in a mobile communication system using multiple antennas Hyun-Seok Oh, Hye-Jeong Lee, Hyun-Seok Yu, Gin-Kyu Choi, Yong-Suk Moon +1 more 2009-08-11
7392012 Apparatus and method for receiving signal in a multiple-input multiple-output communication system Hyun-Seok Oh, Hyun-Seok Yu, Hye-Jeong Lee, Gin-Kyu Choi, Yong-Suk Moon +1 more 2008-06-24
6810334 Method for inspecting wafer defects of a semiconductor device Jung-Hwan Choi, Jeong Hun Kim 2004-10-26