Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8952735 | Integrated circuit | — | 2015-02-10 |
| 6711077 | Wafer burn-in test and wafer test circuit | — | 2004-03-23 |
| 6657903 | Circuit for generating power-up signal | — | 2003-12-02 |
| 6570796 | Wafer burn-in test and wafer test circuit | — | 2003-05-27 |
| 6281742 | Substrate voltage detection control circuit | — | 2001-08-28 |
| 6198344 | Back bias voltage level sensing circuit | — | 2001-03-06 |
| 6147512 | Input buffer circuit | Jong Hoon Park | 2000-11-14 |
| 5708607 | Data read circuit of a memory | Sang Hyun Lee | 1998-01-13 |