Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11494636 | Machine learning-based semiconductor manufacturing yield prediction system and method | Hang Duk Jung, Yong Sik MOON, Min Hwan Lee, Jun Taek Park | 2022-11-08 |
| 11016467 | Method and system for sensing fine changes in processing/equipment measurement data | Byung Min Lee, Tae Young Hong | 2021-05-25 |