Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12411172 | Test system | — | 2025-09-09 |
| 10816590 | Test system | Yoichi Sakamoto | 2020-10-27 |
| 10578663 | Inspection device and inspection method for performing dynamic and static characteristics tests | Yoichi Sakamoto, Takayuki Hamada | 2020-03-03 |
| 10161990 | Inspection system for device to be tested, and method for operating inspection system for device to be tested | Takayuki Hamada, Yoichi Sakamoto, Syuji Ishikawa | 2018-12-25 |