Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8689612 | Pressure tester for printhead integrated circuit carrier | Stephen John Sleijpen, Jan Waszczuk, Eric Patrick O'Donnell, William Granger, David Bernardi +2 more | 2014-04-08 |
| 8006967 | Cradle assembly for a pressure decay leak tester | Stephen John Sleijpen, Jan Waszczuk, Eric Patrick O'Donnell, William Granger, David Bernardi +2 more | 2011-08-30 |
| 7987699 | Pneumatic assembly for a pressure decay tester | Stephen John Sleijpen, Jan Waszczuk, Eric Patrick O'Donnell, William Granger, David Bernardi +2 more | 2011-08-02 |
| 7984640 | Pressure-based tester for a platform assembly | Stephen John Sleijpen, Jan Waszczuk, Eric Patrick O'Donnell, William Granger, David Bernardi +2 more | 2011-07-26 |
| 7971472 | Leak tester for a carrier for printhead integrated circuitry | Stephen John Sleijpen, Jan Waszczuk, Eric Patrick O'Donnell, William Granger, David Bernardi +2 more | 2011-07-05 |
| 7924440 | Imaging apparatus for imaging integrated circuits on an integrated circuit carrier | William Granger, Ralph Lewis Ranger, Graeme Kenneth Bowyer, Jason Mark Thelander | 2011-04-12 |
| 7880900 | Measuring apparatus for performing positional analysis on an integrated circuit carrier | William Granger, Ralph Lewis Ranger, Graeme Kenneth Bowyer, Jason Mark Thelander | 2011-02-01 |
| 7789477 | Method for testing integrity of a base for printhead integrated circuitry | Stephen John Sleijpen, Jan Waszczuk, Eric Patrick O'Donnell, William Granger, David Bernardi +2 more | 2010-09-07 |
| 7786723 | Test stage for a carrier having printhead integrated circuitry thereon | David Burke, Stephen John Sleijpen, Jan Waszczuk | 2010-08-31 |