Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7851273 | Method of testing an integrated circuit die, and an integrated circuit die | Fong-Long Lin | 2010-12-14 |
| 7728361 | Method of testing an integrated circuit die, and an integrated circuit die | Fong-Long Lin | 2010-06-01 |