YG

Yutaka Gomi

SS Sii Semiconductor: 2 patents #40 of 108Top 40%
Overall (All Time): #1,948,066 of 4,157,543Top 50%
2
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Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
9904170 Reticle transmittance measurement method, projection exposure method using the same, and projection exposure device Michihiro Murata 2018-02-27
9733567 Reticle transmittance measurement method, and projection exposure method using the same Michihiro Murata 2017-08-15