Issued Patents All Time
Showing 26–42 of 42 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10349908 | X-ray interferometric imaging system | Wenbing Yun, Janos Kirz, Alan Francis Lyon | 2019-07-16 |
| 10352880 | Method and apparatus for x-ray microscopy | Wenbing Yun, Janos Kirz, Srivatsan Seshadri, Alan Francis Lyon, David Vine | 2019-07-16 |
| 10304580 | Talbot X-ray microscope | Wenbing Yun, David Vine, Janos Kirz, Srivatsan Seshadri | 2019-05-28 |
| 10295486 | Detector for X-rays with high spatial and high spectral resolution | Wenbing Yun, Janos Kirz, Benjamin Donald Stripe | 2019-05-21 |
| 10295485 | X-ray transmission spectrometer system | Wenbing Yun, Srivatsan Seshadri, Janos Kirz | 2019-05-21 |
| 10297359 | X-ray illumination system with multiple target microstructures | Wenbing Yun, Janos Kirz, David Charles Reynolds, Alan Francis Lyon | 2019-05-21 |
| 10269528 | Diverging X-ray sources using linear accumulation | Wenbing Yun, Janos Kirz, Alan Francis Lyon, David Charles Reynolds | 2019-04-23 |
| 10247683 | Material measurement techniques using multiple X-ray micro-beams | Wenbing Yun, Janos Kirz | 2019-04-02 |
| 9874531 | X-ray method for the measurement, characterization, and analysis of periodic structures | Wenbing Yun, Janos Kirz | 2018-01-23 |
| 9823203 | X-ray surface analysis and measurement apparatus | Wenbing Yun, Janos Kirz | 2017-11-21 |
| 9719947 | X-ray interferometric imaging system | Wenbing Yun, Janos Kirz | 2017-08-01 |
| 9594036 | X-ray surface analysis and measurement apparatus | Wenbing Yun, Janos Kirz | 2017-03-14 |
| 9570265 | X-ray fluorescence system with high flux and high flux density | Wenbing Yun, Janos Kirz | 2017-02-14 |
| 9543109 | X-ray sources using linear accumulation | Wenbing Yun, Janos Kirz, Alan Francis Lyon | 2017-01-10 |
| 9448190 | High brightness X-ray absorption spectroscopy system | Wenbing Yun, Janos Kirz | 2016-09-20 |
| 9449781 | X-ray illuminators with high flux and high flux density | Wenbing Yun, Janos Kirz | 2016-09-20 |
| 9390881 | X-ray sources using linear accumulation | Wenbing Yun, Janos Kirz, Alan Francis Lyon | 2016-07-12 |