Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4674090 | Method of using complementary logic gates to test for faults in electronic components | Kong-Chen Chen | 1987-06-16 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4674090 | Method of using complementary logic gates to test for faults in electronic components | Kong-Chen Chen | 1987-06-16 |