Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7294817 | System and methods for determining nonuniformity correction parameters in detector-array imaging | Matthias Voigt, Hans-Gerd Brummel, Dennis H. Lemieux, Visvanathan Ramesh | 2007-11-13 |