JD

Jurgen Durst

SA Siemens Aktiengesellschaft: 2 patents #6,658 of 22,248Top 30%
FE Friedrich-Alexander-Universität Erlangen-Nürnberg: 1 patents #91 of 311Top 30%
📍 Dittenheim, DE: #1 of 4 inventorsTop 25%
Overall (All Time): #1,512,818 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
9498171 Method for examining an object using an X-ray recording system for phase contrast imaging with displacement measurement Gisela Anton, Florian Bayer, Thilo Michel, Georg Pelzer, Jens Rieger +1 more 2016-11-22
9500602 Method for examining an object using an X-ray recording system for phase contrast imaging with stochastic phase scanning Gisela Anton, Florian Bayer, Thilo Michel, Georg Pelzer, Jens Rieger +1 more 2016-11-22
7983397 Method and apparatus for determining one or more characteristics of radiation Thilo Michel, Alexander Korn, Gisela Anton, Daniel Niederlöhner, Michael Böhnel +1 more 2011-07-19