Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4882539 | Monitoring system for electrodynamic wall-thickness and defect testing using a delay line | Gerhard Thiel | 1989-11-21 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4882539 | Monitoring system for electrodynamic wall-thickness and defect testing using a delay line | Gerhard Thiel | 1989-11-21 |