Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5809040 | Testable circuit configuration having a plurality of identical circuit blocks | Achim Dallmann | 1998-09-15 |
| 5457699 | Electronic component with a shift register test architecture (boundary scan) | Klaus Lueders | 1995-10-10 |