CH

Camiel Heffels

SA Siemens Aktiengesellschaft: 9 patents #1,230 of 22,248Top 6%
Basf Se: 2 patents #5,851 of 13,826Top 45%
SW Stichting Voor De Technische Wetenschappen: 1 patents #31 of 169Top 20%
TD Technische Universiteit Delft: 1 patents #75 of 311Top 25%
📍 Schloss Stutensee, DE: #1 of 23 inventorsTop 5%
Overall (All Time): #331,775 of 4,157,543Top 8%
14
Patents All Time

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #TitleCo-InventorsDate
12241831 Measuring facility and method for the measurement of at least two different components of a fluid Konstantin Harr 2025-03-04
11237141 Gas analyzer for measuring nitrogen oxides and sulfur dioxide in exhaust gases Jochen Lang, Benjamin Schmidt 2022-02-01
11226322 Optical gas analyzer and method for measuring nitrogen oxides in an exhaust gas Daniel Roßfeld 2022-01-18
11060969 Gas analyzer 2021-07-13
10871443 Gas analyzer for measuring nitrogen oxides and least one further component of an exhaust gas Benjamin Schmidt 2020-12-22
9030666 Non-dispersive gas analyzer Ralf Bitter, Thomas Hörner 2015-05-12
8558201 Infrared radiator arrangement for a gas analysis device Ralf Bitter, Thomas Hörner 2013-10-15
8268248 Online analyzer Ralf Steuerwald, Dirk Steinmueller 2012-09-18
8158945 Detector arrangement for a nondispersive infrared gas analyzer and method for the detection of a measuring gas component in a gas mixture by means of such a gas analyzer Ralf Bitter, Thomas Hörner 2012-04-17
8044353 Non-dispersive infrared gas analyzer Ralf Bitter, Thomas Hörner, Ludwig Kimmig, Martin Kionke, Michael Ludwig 2011-10-25
7428051 Device for the IR-spectrometric analysis of a solid, liquid or gaseous medium Dirk Steinmueller, Dick Scholten, Peter Lindmueller 2008-09-23
6674529 Method and apparatus for determining physical collective parameters of particles of gases Bernd Sachweh, Matthias Radle, Helmut Biermann, Hans Jürgen Eisen, Jurgen Ettmuller +1 more 2004-01-06
6535283 Apparatus for spectroscopic analysis of a fluid medium by attenuated reflection Thomas Beuermann, Matthias Radle, Benno Sens, Alfred Rennig, Jurgen Ettmuller 2003-03-18
5764358 Method and apparatus for determining the shape characteristics of particles 1998-06-09