Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5834322 | Heat treatment of Si single crystal | Izumi Fusegawa, Hirotoshi Yamagishi, Yukio Karasawa | 1998-11-10 |
| 5823351 | Semiconductor crystal packaging device | Shinichi Matsuo, Shiroyasu Watanabe, Kintaro Kato | 1998-10-20 |
| 5701088 | Method of evaluating a MIS-type semiconductor device | — | 1997-12-23 |
| 5688319 | Method for testing electrical properties of silicon single crystal | Izumi Fusegawa, Hirotoshi Yamagishi, Yukio Karasawa | 1997-11-18 |
| 5683513 | Process and apparatus for manufacturing MOS device | — | 1997-11-04 |
| 5620932 | Method of oxidizing a semiconductor wafer | — | 1997-04-15 |
| 5602061 | Process and apparatus for manufacturing MOS device | — | 1997-02-11 |
| 5534112 | Method for testing electrical properties of silicon single crystal | Izumi Fusegawa, Hirotoshi Yamagishi, Yukio Karasawa | 1996-07-09 |
| 5492845 | Method of producing MOS devices | — | 1996-02-20 |
| 5464779 | Method and apparatus for evaluation of semiconductor production process | — | 1995-11-07 |
| 5442302 | Method and apparatus for measuring high-frequency C-V characteristics of MIS device | — | 1995-08-15 |
| 5386796 | Method for testing quality of silicon wafer | Izumi Fusegawa, Hirotoshi Yamagishi, Yukio Karasawa | 1995-02-07 |
| 5262338 | Method for fabrication of semiconductor device | Izumi Fusegawa, Hirotoshi Yamagishi, Yukio Karasawa | 1993-11-16 |
| 5248378 | Method and apparatus for producing silicon single crystal | Tetsuhiro Oda, Izumi Fusegawa, Hirotoshi Yamagishi, Atsushi Iwasaki, Akiho Maeda +2 more | 1993-09-28 |