Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6228165 | Method of manufacturing crystal of silicon using an electric potential | Scott Matthew Kirkland, Richard William Rudberg, Susumu Sonokawa, Darren Mark Taie, Akira Uchikawa | 2001-05-08 |
| 6030451 | Two camera diameter control system with diameter tracking for silicon ingot growth | Aaron Louis LaBrie | 2000-02-29 |
| 5584930 | Method for measuring the diameter of a single crystal ingot | Nobuo Katsuoka, Yoshihiro Hirano, Atsushi Ozaki | 1996-12-17 |
| 5378900 | Crystal diameter measuring device | Yoshihiro Hirano | 1995-01-03 |
| 5269875 | Method of adjusting concentration of oxygen in silicon single crystal and apparatus for use in the method | Susumu Sonokawa, Kenji Araki, Atsushi Iwasaki | 1993-12-14 |
| 5240684 | Crystal diameter measuring device | Hiroyuki Ibe | 1993-08-31 |
| 5183528 | Method of automatic control of growing neck portion of a single crystal by the CZ method | Hiroshi Ohtsuna | 1993-02-02 |
| 5170061 | Method of and apparatus for measuring oscillation of the outside diameter of a melt surface | — | 1992-12-08 |
| 5138179 | Method of and device for diameter measurement used in automatically controlled crystal growth | Hiroshi Ohtsuna | 1992-08-11 |
| 5129986 | Method for controlling specific resistance of single crystal and an apparatus therefor | Hidetoshi Seki, Seiichiro Ohtsuka | 1992-07-14 |
| 5089238 | Method of forming a temperature pattern of heater and silicon single crystal growth control apparatus using the temperature pattern | Kenji Araki, Akiho Maeda | 1992-02-18 |
| 4794263 | Apparatus for measuring crystal diameter | Nobuo Katsuoka, Yoshihiro Hirano, Atsushi Ozaki | 1988-12-27 |