HN

Hirofumi Nishijo

SC Shin-Etsu Handotai Co.: 1 patents #385 of 679Top 60%
Overall (All Time): #3,569,563 of 4,157,543Top 90%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6174740 Method for analyzing impurities within silicon wafer Yutaka Ohta, Akira Kosugi 2001-01-16