Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4731745 | Automatic dimension analyzer | Kozo Kasukawa, Shigenaga Manabe | 1988-03-15 |
| 4433510 | Method for controlling thickness of wafer-like work pieces under lapping and a lapping machine therefor | Mitsuo Honda | 1984-02-28 |