Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12306208 | Information providing system, server device, and analyzer | Kazuma Watanabe, Hiroshi Arai, Yuichiro Ikeda, Hideo Nakajima, Kenji Yamasaki +1 more | 2025-05-20 |
| 11519936 | Scanning probe microscope and scanning probe microscope optical axis adjustment method | — | 2022-12-06 |
| 11499989 | Surface analysis device | Kanji Kobayashi | 2022-11-15 |
| 11454647 | Scanning type probe microscope and control device for scanning type probe microscope | Kazuma Watanabe, Keita Fujino, Kenji Yamasaki, Hideo Nakajima, Yuichiro Ikeda +1 more | 2022-09-27 |
| 11415596 | Scanning probe microscope and analysis method | Hiroshi Arai | 2022-08-16 |
| 11162975 | Surface analyzer | — | 2021-11-02 |
| 11073535 | Scanning probe microscope with case and elastic body | — | 2021-07-27 |
| 10846547 | Data correction method, computer program for causing computer to perform data correction method, image processor, and scanning probe microscope | Kenji Yamasaki | 2020-11-24 |
| 10641790 | Scanning probe microscope | Kazuma Watanabe, Keita Fujino, Eiji Iida, Kenji Yamasaki, Hideo Nakajima +2 more | 2020-05-05 |
| 10598691 | Scanning probe microscope and light intensity adjusting method | Kazuma Watanabe, Keita Fujino, Eiji Iida, Kenji Yamasaki, Hideo Nakajima +2 more | 2020-03-24 |
| 10564183 | Scanning probe microscope and surface image correction method | — | 2020-02-18 |
| 10564180 | Scanning probe microscope using gradual increases and decreases in relative speed when shifting and reciprocating the scanned probe across a sample | — | 2020-02-18 |
| 10254307 | Scanning probe microscope | Kanji Kobayashi | 2019-04-09 |
| 10168354 | Scanning probe microscope | — | 2019-01-01 |
| 10088499 | Scanning probe microscope | Kanji Kobayashi | 2018-10-02 |
| 9689892 | Scanning probe microscope | — | 2017-06-27 |
| D724128 | Probe microscope | Hiroshi Muraoka | 2015-03-10 |