Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8390280 | Inspection of an electrically conductive object using eddy currents | Dave Badoux, Johan van der Steen | 2013-03-05 |
| 8076929 | Device and method for detecting an anomaly in an assembly of a first and a second object | Dave Badoux | 2011-12-13 |
| 7514918 | Monitoring wall thickness | — | 2009-04-07 |
| 6734670 | Determining a surface profile of an object | — | 2004-05-11 |
| 6593737 | Method for measuring the wall thickness of an electrically conductive object | Mark Theodoor Looljer, Johan van der Steen | 2003-07-15 |
| 6570379 | Method for inspecting an object of electrically conducting material | Mark Theodoor Looijer, Johan van der Steen | 2003-05-27 |
| 6538435 | Method for detecting an anomaly in an object of electrically conductive material along first and second direction at inspection points | Mark Theodoor Looijer, Johan van der Steen | 2003-03-25 |
| 5053243 | Preparation of adsorbent layers | Hubertus J. A. Schuurmans, Gerard Hoekstein | 1991-10-01 |