Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7307326 | Light receiving element and light receiving device incorporating circuit and optical disk drive | Tatsuya Morioka, Yoshihiko Tani, Isamu Ohkubo, Hideo Wada | 2007-12-11 |
| 7098489 | Split type light receiving element and circuit-built-in light-receiving element and optical disk drive | Tatsuya Morioka, Yoshihiko Tani, Isamu Ohkubo | 2006-08-29 |
| 6873025 | Photodiode device including window defined in passivation layer for removing electrostatic charge | Hideo Wada, Isamu Ohkubo, Kazuhiro Natsuaki, Naoki Fukunaga | 2005-03-29 |
| 6747316 | Surface-channel metal-oxide semiconductor transistors, their complementary field-effect transistors and method of producing the same | Toshimasa Matsuoka, Seizou Kakimoto, Hiroshi Iwata | 2004-06-08 |
| 6720627 | Semiconductor device having junction depths for reducing short channel effect | Hiroshi Iwata, Masayuki Nakano, Seizou Kakimoto, Toshimasa Matsuoka | 2004-04-13 |
| 6580095 | Circuit-containing photodetector, method of manufacturing the same, and optical device using circuit-containing photodetector | Yoshihiko Tani, Tatsuya Morioka, Seizo Kakimoto, Toshihiko Fukushima | 2003-06-17 |
| 6492702 | Circuit-incorporating light receiving device | Toshihiko Fukushima, Masaru Kubo | 2002-12-10 |
| 6255702 | Semiconductor device having junction depths for reducing short channel effect | Hiroshi Iwata, Masayuki Nakano, Seizou Kakimoto, Toshimasa Matsuoka | 2001-07-03 |
| 5960319 | Fabrication method for a semiconductor device | Hiroshi Iwata, Masayuki Nakano, Seizou Kakimoto, Toshimasa Matsuoka | 1999-09-28 |
| 5903029 | Insulated-gate field-effect transistor and method for producing the same | Seizo Kakimoto | 1999-05-11 |
| 5362670 | Semiconductor device producing method requiring only two masks for completion of element isolation regions and P- and N-wells | Katsuji Iguchi, Akio Kawamura, Shinichi Sato, Tomohiko Tateyama | 1994-11-08 |
| 5342796 | Method for controlling gate size for semiconduction process | Sung Tae Ahn | 1994-08-30 |