Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7043675 | Logic circuit test apparatus and logic circuit test method | Hideyuki Ichihara | 2006-05-09 |
| 6886076 | Semiconductor integrated circuit device having connection pads for superposing expansion memory | Hitoshi Saito, Toyohiko Tanaka, Hitoshi Imai | 2005-04-26 |
| 6724182 | Tester and testing method for differential data drivers | Toyohiko Tanaka, Hitoshi Imai, Hitoshi Saitoh | 2004-04-20 |