Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7735053 | Correction method and correction system for design data or mask data, validation method and validation system for design data or mask data, yield estimation method for semiconductor integrated circuit, method for improving design rule, mask production method, and semiconductor integrated circuit production method | — | 2010-06-08 |
| 6335981 | Photomask pattern correcting method and photomask corrected by the same and photomask pattern correcting device | — | 2002-01-01 |
| 6137901 | Photomask pattern correcting method and photomask corrected by the same and photomask pattern correcting device | — | 2000-10-24 |
| 5441835 | Photomask and projection exposure mechanism using the same | — | 1995-08-15 |