Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12099002 | Single-beam photothermal measurement apparatus and measurement method for absorptive defects | Shijie Liu, Kaizao Ni, Jianda Shao, Weiwei WANG, Yingjia Li +1 more | 2024-09-24 |
| 11175220 | Surface defect measuring apparatus and method by microscopic scattering polarization imaging | Jianda Shao, Shijie Liu, Kaizao Ni, Shenghao Wang, You Zhou +2 more | 2021-11-16 |