Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12398485 | Method of detecting crystallographic defects and method of growing an ingot | Xing Wei, Xun Wang, Zhongying Xue | 2025-08-26 |
| 12092588 | Method for characterizing defects in silicon crystal | Xing Wei, Zhongying Xue | 2024-09-17 |
| 11352713 | Heat shield structure for single crystal production furnace and single crystal production furnace | Zhongying Xue, Tao Wei, Xing Wei, ZHAN-YANG LI, Minghao LI | 2022-06-07 |