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Liren Li

SC Shanghai Ic R&D Center Co.: 1 patents #28 of 75Top 40%
Overall (All Time): #908,508 of 4,157,543Top 25%
5
Patents All Time

Issued Patents All Time

Showing 1–5 of 5 patents

Patent #TitleCo-InventorsDate
12288725 Critical dimension error analysis method Xueru YU, Hongxia SUN, Chen Li, Pengfei Wang, Jiebin Duan +6 more 2025-04-29
D830778 Meal box Jinglin Li, Wei Zhang 2018-10-16
D830779 Meal box Jinglin Li, Wei Zhang 2018-10-16
D816415 Meal box Jinglin Li, Wei Zhang 2018-05-01
D816416 Meal box Jinglin Li, Wei Zhang 2018-05-01