Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12299866 | Method for automatically detecting wafer backside brightfield image anomaly | Xu Chen, Yansheng Wang, Zhengying Wei | 2025-05-13 |
| 11347959 | Classification method for automatically identifying wafer spatial pattern distribution | Xu Chen | 2022-05-31 |