Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12260924 | Testability circuit and read and write path decoupling circuit of SRAM | Junsheng Chen | 2025-03-25 |
| 12044723 | Circuit for temperature stress test for memory chips | Junsheng Chen | 2024-07-23 |
| 11462290 | Wafer acceptance test module and method for a static memory function test | Junsheng Chen, Zhaoying Huang | 2022-10-04 |